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"Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive ..."

Athanasios Dimakos et al. (2015)

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DOI: 10.1007/S10836-015-5534-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Athanasios Dimakos, Haralampos-G. D. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld:
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors. J. Electron. Test. 31(4): 381-394 (2015)

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