"Detectability Challenges of Bridge Defects in FinFET Based Logic Cells."

Freddy Forero et al. (2018)

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DOI: 10.1007/S10836-018-5714-0

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type: Journal Article

metadata version: 2024-04-19

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Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac:
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells. J. Electron. Test. 34(2): 123-134 (2018)

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