"A Scan-BIST Structure to Test Delay Faults in Sequential Circuits."

Patrick Girard et al. (1999)

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DOI: 10.1023/A:1008305507376

access: closed

type: Journal Article

metadata version: 2023-03-21

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Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel:
A Scan-BIST Structure to Test Delay Faults in Sequential Circuits. J. Electron. Test. 14(1-2): 95-102 (1999)

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