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"New Method for Determining and Predicting Test Interconnect Pin Current ..."

Eli Gurevich, Pranit Deshmukh (2020)

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DOI: 10.1007/S10836-020-05896-Z

access: closed

type: Journal Article

metadata version: 2020-09-19

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Eli Gurevich, Pranit Deshmukh:
New Method for Determining and Predicting Test Interconnect Pin Current Carrying Capacity. J. Electron. Test. 36(4): 445-460 (2020)

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