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"On Reducing Test Data Volume for Circular Scan Architecture Using Modified ..."

Muralidharan Jayabalan et al. (2021)

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DOI: 10.1007/S10836-021-05975-9

access: closed

type: Journal Article

metadata version: 2023-07-26

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Muralidharan Jayabalan, E. Srinivas, Francis H. Shajin, Paulthurai Rajesh:
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization. J. Electron. Test. 37(5): 577-592 (2021)

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