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ORCID"Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift."
Hui Jiang et al. (2023)
- Hui Jiang
, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas:
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. J. Electron. Test. 39(2): 227-243 (2023)
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