Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Functional versus random test generation for sequential circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Margot Karam, Gabriele Saucier (1993)

> Home

Details and statistics

DOI: 10.1007/BF00971938

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/KaramS93
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/KaramS93
Margot Karam, Gabriele Saucier:
Functional versus random test generation for sequential circuits. J. Electron. Test. 4(1): 33-41 (1993)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.