"SAT-based Silicon Debug of Electrical Errors under Restricted ..."

Binod Kumar, Masahiro Fujita, Virendra Singh (2019)

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DOI: 10.1007/S10836-019-05830-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Binod Kumar, Masahiro Fujita, Virendra Singh:
SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement. J. Electron. Test. 35(5): 655-678 (2019)

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