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"Dynamic Power Supply Current Testing of CMOS SRAMs."

Jian Liu, Rafic Z. Makki, Ayman I. Kayssi (2000)

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DOI: 10.1023/A:1008324900917

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jian Liu, Rafic Z. Makki, Ayman I. Kayssi:
Dynamic Power Supply Current Testing of CMOS SRAMs. J. Electron. Test. 16(5): 499-511 (2000)

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