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"Reducing Test Time Using an Enhanced RF Loopback."

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin (2007)

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DOI: 10.1007/S10836-007-5026-2

access: closed

type: Journal Article

metadata version: 2023-09-30

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Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
Reducing Test Time Using an Enhanced RF Loopback. J. Electron. Test. 23(6): 613-623 (2007)

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