


default search action
"On-Wafer Calibration Technique for High Frequency Measurement with ..."
B. M. Farid Rahman et al. (2015)
- B. M. Farid Rahman, Yujia Peng, TengXing Wang

, Tian Xia, Guoan Wang:
On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current Tuning. J. Electron. Test. 31(1): 67-73 (2015)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID













