"A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting."

Luís Rolíndez et al. (2006)

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DOI: 10.1007/S10836-006-9500-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

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Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro:
A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electron. Test. 22(4-6): 325-335 (2006)

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