"Combining Scan Test and Built-in Self Test."

Markus Seuring (2006)

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DOI: 10.1007/S10836-006-8950-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Markus Seuring:
Combining Scan Test and Built-in Self Test. J. Electron. Test. 22(3): 297-299 (2006)

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