"Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM ..."

Shuting Shi et al. (2021)

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DOI: 10.1007/S10836-021-05940-6

access: closed

type: Journal Article

metadata version: 2025-08-17

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Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37(2): 271-278 (2021)

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