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"Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive ..."
Michihiro Shintani et al. (2016)
- Michihiro Shintani
, Takumi Uezono, Kazumi Hatayama, Kazuya Masu
, Takashi Sato
:
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing. J. Electron. Test. 32(5): 601-609 (2016)
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