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2020 – today
- 2023
[j8]Yangchao Zhang, Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Masanori Hashimoto:
Vulnerability Estimation of DNN Model Parameters with Few Fault Injections. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 106(3): 523-531 (2023)- [c19]Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Subrata Kumar Kundu:
An Intelligent Diagnostic Technique for Reliable Operation of Edge AI. ITSC 2023: 4254-4259 - 2022
- [c18]Yangchao Zhang, Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Masanori Hashimoto:
Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections. DATE 2022: 60-63 - [c17]Takumi Uezono, Yi He, Yanjing Li:
Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators. ITC 2022: 465-473 - 2021
- [c16]Yi He
, Takumi Uezono, Yanjing Li:
Efficient Functional In-Field Self-Test for Deep Learning Accelerators. ITC 2021: 93-102 - 2020
- [c15]Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Kojiro Ito, Masanori Hashimoto:
Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing. ITC 2020: 1-5
2010 – 2019
- 2016
- [j7]Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, Takashi Sato:
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing. J. Electron. Test. 32(5): 601-609 (2016) - [c14]Takumi Uezono, Tadanobu Toba, Ken-ichi Shimbo, Fumihiko Nagasaki, Kenji Kawamura:
Evaluation Technique for Soft-Error Rate in Terrestrial Environment Utilizing Low-Energy Neutron Irradiation. ATS 2016: 293-297 - 2014
- [j6]Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, Takashi Sato:
A Variability-Aware Adaptive Test Flow for Test Quality Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(7): 1056-1066 (2014) - 2010
- [j5]Takumi Uezono, Kazuya Masu, Takashi Sato:
A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation. IEICE Trans. Electron. 93-C(3): 324-331 (2010) - [c13]Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu:
Decomposition of drain-current variation into gain-factor and threshold voltage variations. ISCAS 2010: 1053-1056 - [c12]Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato:
Scan based process parameter estimation through path-delay inequalities. ISCAS 2010: 3553-3556 - [c11]Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato:
Path clustering for adaptive test. VTS 2010: 15-20
2000 – 2009
- 2009
- [j4]Takumi Uezono, Takashi Sato, Kazuya Masu:
One-Shot Voltage-Measurement Circuit Utilizing Process Variation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(4): 1024-1030 (2009) - [c10]Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu:
An Adaptive Test for Parametric Faults Based on Statistical Timing Information. Asian Test Symposium 2009: 151-156 - 2008
- [j3]Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu:
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(4): 951-956 (2008) - 2007
- [c9]Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu:
Improvement of power distribution network using correlation-based regression analysis. ACM Great Lakes Symposium on VLSI 2007: 513-516 - [c8]Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu:
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. ISQED 2007: 21-26 - [c7]Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu:
Weakness Identification for Effective Repair of Power Distribution Network. PATMOS 2007: 222-231 - [c6]Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu:
Adaptable wire-length distribution with tunable occupation probability. SLIP 2007: 1-8 - 2006
- [j2]Takumi Uezono, Kenichi Okada, Kazuya Masu:
Statistical Modeling of a Via Distribution for Yield Estimation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 89-A(12): 3579-3584 (2006) - [c5]Takumi Uezono, Kenichi Okada, Kazuya Masu:
Via Distribution Model for Yield Estimation. ISQED 2006: 479-484 - [c4]Kenichi Okada, Takumi Uezono, Kazuya Masu:
Estimation of Power Reduction by On-Chip Transmission Line for 45nm Technology. PATMOS 2006: 181-190 - 2005
- [j1]Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu:
Wire Length Distribution Model for System LSI. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 88-A(12): 3445-3452 (2005) - [c3]Junpei Inoue, Hiroyuki Ito, Shinichiro Gomi, Takanori Kyogoku, Takumi Uezono, Kenichi Okada, Kazuya Masu:
Evaluation of on-chip transmission line interconnect using wire length distribution. ASP-DAC 2005: 133-138 - [c2]Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu:
Wire Length Distribution Model Considering Core Utilization for System on Chip. ISVLSI 2005: 276-277 - [c1]Takumi Uezono, Junpei Inoue, Takanori Kyogoku, Kenichi Okada, Kazuya Masu:
Prediction of delay time for future LSI using on-chip transmission line interconnects. SLIP 2005: 7-12
Coauthor Index
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