Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Reliability Statistics Perspective on the Pitfalls of Standard ..."

Cher Ming Tan, Kelvin Ngan Chong Yeo (2001)

> Home

Details and statistics

DOI: 10.1023/A:1011102127642

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/TanY01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/TanY01
Cher Ming Tan, Kelvin Ngan Chong Yeo:
A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level Electromigration Accelerated Test (SWEAT). J. Electron. Test. 17(1): 63-68 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.