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"A Reliability Statistics Perspective on the Pitfalls of Standard ..."
Cher Ming Tan, Kelvin Ngan Chong Yeo (2001)
- Cher Ming Tan, Kelvin Ngan Chong Yeo:
A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level Electromigration Accelerated Test (SWEAT). J. Electron. Test. 17(1): 63-68 (2001)
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