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"An Output Response Analyzer Circuit for ADC Built-in Self-Test."

Hsin-Wen Ting (2011)

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DOI: 10.1007/S10836-011-5235-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hsin-Wen Ting:
An Output Response Analyzer Circuit for ADC Built-in Self-Test. J. Electron. Test. 27(4): 455-464 (2011)

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