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ORCID"On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with ..."
Daniela De Venuto, Michael J. Ohletz (2001)
- Daniela De Venuto
, Michael J. Ohletz:
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. J. Electron. Test. 17(3-4): 243-253 (2001)
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