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"An Accumulator-Based BIST Approach for Two-Pattern Testing."

Ioannis Voyiatzis et al. (1999)

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DOI: 10.1023/A:1008340925177

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/et/VoyiatzisPNH99
Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis:
An Accumulator-Based BIST Approach for Two-Pattern Testing. J. Electron. Test. 15(3): 267-278 (1999)

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