"The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM."

Wenxin Yu, Yongbo Sui, Junnian Wang (2016)

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DOI: 10.1007/S10836-016-5597-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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Wenxin Yu, Yongbo Sui, Junnian Wang:
The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM. J. Electron. Test. 32(4): 459-465 (2016)

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