"A cost-efficient self-configurable BIST technique for testing ..."

Jianfeng Zhu et al. (2011)

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DOI: 10.1007/S10836-011-5238-3

access: closed

type: Journal Article

metadata version: 2022-06-12

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Jianfeng Zhu, Hu He, Dong Wu, Liyang Pan:
A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnect. J. Electron. Test. 27(5): 647-655 (2011)

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