"Data-driven testing methodology for RFID systems."

An Lu et al. (2010)

> Home

Details and statistics

DOI: 10.1007/S11704-010-0387-6

access: closed

type: Journal Article

metadata version: 2018-02-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/fcsc/LuFXCL10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/fcsc/LuFXCL10
An Lu, Wenbin Fang, Chang Xu, Shing-Chi Cheung, Yu Liu:
Data-driven testing methodology for RFID systems. Frontiers Comput. Sci. China 4(3): 354-364 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.