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"Combined classifier for cross-project defect prediction: an extended ..."

Yun Zhang et al. (2018)

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DOI: 10.1007/S11704-017-6015-Y

access: closed

type: Journal Article

metadata version: 2019-09-25

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Yun Zhang, David Lo, Xin Xia, Jianling Sun:
Combined classifier for cross-project defect prediction: an extended empirical study. Frontiers Comput. Sci. 12(2): 280-296 (2018)

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