"Automatic Characterization of Exploitable Faults: A Machine Learning Approach."

Sayandeep Saha et al. (2017)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2020-05-11

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  - https://dblp.org/rec/journals/iacr/SahaJPMBD17
Sayandeep Saha, Dirmanto Jap, Sikhar Patranabis, Debdeep Mukhopadhyay, Shivam Bhasin, Pallab Dasgupta:
Automatic Characterization of Exploitable Faults: A Machine Learning Approach. IACR Cryptol. ePrint Arch. 2017: 1008 (2017)

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