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"The Effective Carrier Ionization Rate in a p-n Junction at Avalanche ..."

David P. Kennedy, Redmond R. O'Brien (1965)

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DOI: 10.1147/RD.95.0422

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/KennedyO65a
David P. Kennedy, Redmond R. O'Brien:
The Effective Carrier Ionization Rate in a p-n Junction at Avalanche Breakdown. IBM J. Res. Dev. 9(5): 422-423 (1965)

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