"Reliability evaluation of logic circuits based on transient faults ..."

Shuo Cai et al. (2017)

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DOI: 10.1587/ELEX.14.20170128

access: open

type: Journal Article

metadata version: 2025-02-27

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Shuo Cai, Fei Yu, Weizheng Wang, Tieqiao Liu, Peng Liu, Wei Wang:
Reliability evaluation of logic circuits based on transient faults propagation metrics. IEICE Electron. Express 14(7): 20170128 (2017)

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