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"Reliability evaluation of logic circuits based on transient faults ..."
Shuo Cai et al. (2017)
- Shuo Cai, Fei Yu, Weizheng Wang, Tieqiao Liu, Peng Liu, Wei Wang:
Reliability evaluation of logic circuits based on transient faults propagation metrics. IEICE Electron. Express 14(7): 20170128 (2017)
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