"A novel power-efficient IC test scheme."

Ding Deng, Xiaowen Chen, Yang Guo (2017)

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DOI: 10.1587/ELEX.14.20170462

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/DengCG17
Ding Deng, Xiaowen Chen, Yang Guo:
A novel power-efficient IC test scheme. IEICE Electron. Express 14(13): 20170462 (2017)

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