"Application dependent FPGA interconnect test method with small test ..."

Xinyu He, Jinmei Lai (2025)

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DOI: 10.1587/ELEX.21.20230495

access: open

type: Journal Article

metadata version: 2025-08-28

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Xinyu He, Jinmei Lai:
Application dependent FPGA interconnect test method with small test configuration number using SMT net-grouping constraints. IEICE Electron. Express 22(10): 20230495 (2025)

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