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"Duplication-assisted reliability enhancement in flash storage system."

Ki-Jin Kim, Seung-Ho Lim (2017)

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DOI: 10.1587/ELEX.14.20171131

access: open

type: Journal Article

metadata version: 2021-02-12

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  - electronic edition via DOI (open access)
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  dblp key:
  - journals/ieiceee/KimL17a
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  - https://dblp.org/rec/journals/ieiceee/KimL17a
Ki-Jin Kim, Seung-Ho Lim:
Duplication-assisted reliability enhancement in flash storage system. IEICE Electron. Express 14(24): 20171131 (2017)

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