"Transient program operation model considering distribution of electrons in ..."

Dong Chan Lee, Hyungcheol Shin (2020)

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DOI: 10.1587/ELEX.17.20200335

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/LeeS20
Dong Chan Lee, Hyungcheol Shin:
Transient program operation model considering distribution of electrons in 3D NAND flash memories. IEICE Electron. Express 17(23): 20200335 (2020)

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