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ORCID"Reconfigurable scan architecture for test power and data volume reduction."
Hyunggoy Oh et al. (2017)
- Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
Reconfigurable scan architecture for test power and data volume reduction. IEICE Electron. Express 14(13): 20170415 (2017)
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