"Blade-type phase-change random access memory technology, challenge and ..."

Weikun Xie et al. (2023)

> Home

Details and statistics

DOI: 10.1587/ELEX.20.20230307

access: open

type: Journal Article

metadata version: 2024-01-01

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ieiceee/XieWCW23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/XieWCW23
Weikun Xie, Lei Wang, Long Chen, Houjun Wang:
Blade-type phase-change random access memory technology, challenge and prospect. IEICE Electron. Express 20(19): 20230307 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.