"Reduction of Area per Good Die for SoC Memory Built-In Self-Test."

Masayuki Arai et al. (2010)

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DOI: 10.1587/TRANSFUN.E93.A.2463

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type: Journal Article

metadata version: 2020-04-11

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Masayuki Arai, Tatsuro Endo, Kazuhiko Iwasaki, Michinobu Nakao, Iwao Suzuki:
Reduction of Area per Good Die for SoC Memory Built-In Self-Test. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(12): 2463-2471 (2010)

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