"Reordering-Based Test Pattern Reduction Considering Critical Area-Aware ..."

Masayuki Arai, Kazuhiko Iwasaki (2017)

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DOI: 10.1587/TRANSFUN.E100.A.1488

access: closed

type: Journal Article

metadata version: 2020-04-11

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Masayuki Arai, Kazuhiko Iwasaki:
Reordering-Based Test Pattern Reduction Considering Critical Area-Aware Weighted Fault Coverage. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 100-A(7): 1488-1495 (2017)

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