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"A Comprehensive Model for Write Disturbance in Resistive Memory Composed ..."

Yoshiaki Asao, Fumio Horiguchi (2017)

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DOI: 10.1587/TRANSELE.E100.C.329

access: closed

type: Journal Article

metadata version: 2020-04-11

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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/AsaoH17
Yoshiaki Asao, Fumio Horiguchi:
A Comprehensive Model for Write Disturbance in Resistive Memory Composed of Cross-Point Array. IEICE Trans. Electron. 100-C(3): 329-339 (2017)

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