"Stress-Induced Capacitance of Partially Depleted MOSFETs from Ring ..."

Wen-Teng Chang (2012)

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DOI: 10.1587/TRANSELE.E95.C.802

access: closed

type: Journal Article

metadata version: 2020-04-11

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Wen-Teng Chang:
Stress-Induced Capacitance of Partially Depleted MOSFETs from Ring Oscillator Delay. IEICE Trans. Electron. 95-C(5): 802-806 (2012)

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