"Image Restoration for Quantifying TFT-LCD Defect Levels."

Kyu Nam Choi, No Kap Park, Suk In Yoo (2008)

Details and statistics

DOI: 10.1093/IETISY/E91-D.2.322

access: closed

type: Journal Article

metadata version: 2022-08-16

a service of  Schloss Dagstuhl - Leibniz Center for Informatics