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"Analysis of Effective Material Properties of Metal Dummy Fills in a CMOS Chip."

Takuichi Hirano, Ning Li, Kenichi Okada (2017)

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DOI: 10.1587/TRANSCOM.2016EBT0004

access: closed

type: Journal Article

metadata version: 2021-04-09

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  dblp key:
  - journals/ieicet/HiranoLO17
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/HiranoLO17
Takuichi Hirano, Ning Li, Kenichi Okada:
Analysis of Effective Material Properties of Metal Dummy Fills in a CMOS Chip. IEICE Trans. Commun. 100-B(5): 793-798 (2017)

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