"An Efficient Test and Repair Flow for Yield Enhancement of ..."

Tsu-Lin Li, Masaki Hashizume, Shyue-Kung Lu (2013)

> Home

Details and statistics

DOI: 10.1587/TRANSINF.E96.D.2026

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/LiHL13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/LiHL13
Tsu-Lin Li, Masaki Hashizume, Shyue-Kung Lu:
An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs. IEICE Trans. Inf. Syst. 96-D(9): 2026-2030 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.