"Characterization of Germanium Nanocrystallites Grown on SiO2 by ..."

Katsunori Makihara et al. (2005)

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DOI: 10.1093/IETELE/E88-C.4.705

access: closed

type: Journal Article

metadata version: 2020-04-11

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Katsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Germanium Nanocrystallites Grown on SiO₂ by a Conductive AFM Probe Technique. IEICE Trans. Electron. 88-C(4): 705-708 (2005)

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