"Phonon-Drag Contribution to Seebeck Coefficient in P-Type Si, Ge and ..."

Veerappan Manimuthu et al. (2017)

> Home

Details and statistics

DOI: 10.1587/TRANSELE.E100.C.482

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/ManimuthuOASHI17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ManimuthuOASHI17
Veerappan Manimuthu, Muthusamy Omprakash, Mukannan Arivanandhan, Faiz Salleh, Yasuhiro Hayakawa, Hiroya Ikeda:
Phonon-Drag Contribution to Seebeck Coefficient in P-Type Si, Ge and Si_1-xGe_x. IEICE Trans. Electron. 100-C(5): 482-485 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.