"CMOS Floating Gate Defect Detection Using Supply Current Test with DC ..."

Hiroyuki Michinishi et al. (2004)

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type: Journal Article

metadata version: 2020-04-11

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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Trans. Inf. Syst. 87-D(3): 551-556 (2004)

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