"Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable ..."

Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara (2005)

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DOI: 10.1093/IETISY/E88-D.6.1210

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type: Journal Article

metadata version: 2020-04-11

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Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara:
Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST. IEICE Trans. Inf. Syst. 88-D(6): 1210-1216 (2005)

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