Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ..."

Hideyuki Noda et al. (2006)

> Home

Details and statistics

DOI: 10.1093/IETELE/E89-C.11.1612

access: closed

type: Journal Article

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/NodaDMKMA06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/NodaDMKMA06
Hideyuki Noda, Katsumi Dosaka, Hans Jürgen Mattausch, Tetsushi Koide, Fukashi Morishita, Kazutami Arimoto:
A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC. IEICE Trans. Electron. 89-C(11): 1612-1619 (2006)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.