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ORCID"Design for Testability That Reduces Linearity Testing Time of SAR ADCs."
Tomohiko Ogawa et al. (2011)
- Tomohiko Ogawa, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu
:
Design for Testability That Reduces Linearity Testing Time of SAR ADCs. IEICE Trans. Electron. 94-C(6): 1061-1064 (2011)
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