"Design for Testability That Reduces Linearity Testing Time of SAR ADCs."

Tomohiko Ogawa et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.1061

access: closed

type: Journal Article

metadata version: 2023-03-21

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Tomohiko Ogawa, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu:
Design for Testability That Reduces Linearity Testing Time of SAR ADCs. IEICE Trans. Electron. 94-C(6): 1061-1064 (2011)

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