"Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared ..."

Akio Ohta et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.879

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/OhtaGNWMHM12
Akio Ohta, Yuta Goto, Shingo Nishigaki, Guobin Wei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering. IEICE Trans. Electron. 95-C(5): 879-884 (2012)

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