"Numerical Analysis of the Effect of Thin-Film Thickness and Material in ..."

Yen-Lin Pan, Cheng-Chi Tai, Dong-Shong Liang (2012)

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DOI: 10.1587/TRANSELE.E95.C.86

access: closed

type: Journal Article

metadata version: 2020-04-11

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Yen-Lin Pan, Cheng-Chi Tai, Dong-Shong Liang:
Numerical Analysis of the Effect of Thin-Film Thickness and Material in Field Mapping of Eddy-Current Probes Using Photoinductive Technique. IEICE Trans. Electron. 95-C(1): 86-92 (2012)

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