Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"On-Chip Charged Device Model ESD Protection Design Method Using Very Fast ..."

Jae-Young Park et al. (2010)

> Home

Details and statistics

DOI: 10.1587/TRANSELE.E93.C.625

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/ParkSKJJK10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ParkSKJJK10
Jae-Young Park, Jong-Kyu Song, Dae-Woo Kim, Chang-Soo Jang, Won-Young Jung, Taek-Soo Kim:
On-Chip Charged Device Model ESD Protection Design Method Using Very Fast Transmission Line Pulse System for RF ICs. IEICE Trans. Electron. 93-C(5): 625-630 (2010)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.