"A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip ..."

Hong-Ming Shieh, Jin-Fu Li (2008)

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DOI: 10.1093/IETISY/E91-D.10.2428

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type: Journal Article

metadata version: 2023-10-17

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Hong-Ming Shieh, Jin-Fu Li:
A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip Designs. IEICE Trans. Inf. Syst. 91-D(10): 2428-2434 (2008)

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